Mitrovic N, Danković D, Prijić Z, Stojadinović N. MODELING OF NBTI DEGRADATION IN P-CHANNEL VDMOSFETS. JAES [Internet]. 2020 Oct. 14 [cited 2026 Jul. 12];18(4):515-9. Available from: https://asistent.ceon.rs/index.php/jaes/article/view/26760